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LayTec
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About LayTec
LayTec is a major provider of integrated optical metrology systems for thin-film processes in the compound semiconductor and photovoltaics industry. LayTec sensors are used in a broad range of thin-film applications such as compound semiconductor epitaxy, photovoltaic, oxide and organic deposition. Advanced use of measurement techniques such as reflectometry, emissivity corrected pyrometry, laser deflectometry, reflectance anisotropy spectroscopy are uniquely combined to create our series of novel products. LayTec’s in-situ metrology provides access to all key thin-film parameters in real-time – either during the deposition process or in-line.
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Signals from LayTec
3 published signals
Technology & Infrastructure
LayTec used EpiTT for real-time reflectance monitoring during MOCVD growth processes
Reported by LayTec
Research & Knowledge
LayTec published a paper of the month titled Scalable Growth of (AlxGa1−x)2O3 Thin Films on 2- and 4-Inch Sapphire
Reported by LayTec
Research & Knowledge
LayTec published an application note with Singfilm Solar Pte. Ltd. detailing how LayTec's Flames in-line metrology system is integrated into Singfilm Solar Pte. Ltd.'s perovskite evaporation process to monitor film thickness in real time.
Reported by LayTec